Apparatuses for testing the lateral and axial confocality of a scanning and descanning microscope component group
US12216019B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2022 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Jul 15, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0024
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An auxiliary apparatus for testing the confocality of a scanning and descanning microscope component group has a connector configured for connecting the auxiliary apparatus in a defined relative position to the scanning and descanning microscope component group, and an optical axis running at a fixed orientation with respect to the connector. Further, the auxiliary apparatus has an auxiliary detector with a plurality of auxiliary detection apertures in a plurality of auxiliary detection aperture positions that are arranged at distances in direction of the optical axis and laterally with respect to the optical axis; and an auxiliary light source providing auxiliary light through a plurality of auxiliary emission apertures in a plurality of auxiliary emission aperture positions arranged at distances in direction of the optical axis and laterally with respect to the optical axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.