Patent · US Active

Apparatus for drying wafer and method for drying wafer

US12216408B2 · kind B2 · utility

0Cited by
5References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 17, 2022
Grant dateFeb 4, 2025
Priority date
Expiry dateJun 12, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/427
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An apparatus for drying a wafer, includes: a drying chamber; a supercritical fluid supply module configured to supply supercritical fluid to the drying chamber; a main exhaust line connected to the drying chamber and in which a main valve is installed; and an auxiliary exhaust unit connected to the main exhaust line. The auxiliary exhaust unit includes: an auxiliary exhaust line connected to the main exhaust line and configured to exhaust the supercritical fluid from the drying chamber when the main valve is closed; a negative pressure tank installed in the auxiliary exhaust line; a first valve, installed in the auxiliary exhaust line, that is configured to be opened when the main valve is closed; and a second valve, installed in the auxiliary exhaust line, that is configured to be opened in conjunction with the first valve.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.