Gain and offset diagnosis of analog-to-digital converters in sensor signal path
US12218679B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 2022 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Jul 23, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/0626
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A sensor circuit, having a startup phase and an operation phase, includes: a sensor configured to generate a sensor signal based on a measured property, wherein the sensor signal has a frequency spectrum defined by a first frequency and a second frequency that is greater than the first frequency; a signal processing circuit including an analog-to-digital converter (ADC) configured to convert the sensor signal into a digital sensor signal; and an offset diagnosis circuit. The offset diagnosis circuit includes: a low pass filter having a cutoff frequency less than the first frequency and configured to generate a filtered signal based on the digital sensor signal; an offset register configured to store a startup signal value of the filtered signal during the startup phase; and an offset comparator circuit configured to set a threshold range based on the startup signal value for use during the operation phase.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.