Patent · US Active

Semiconductor device related to calibrating termination resistance

US12224747B2 · kind B2 · utility

1Cited by
2References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2023
Grant dateFeb 11, 2025
Priority date
Expiry dateOct 12, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/2254
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor system includes a controller configured to apply a command address, a first chip selection signal, and a second chip selection signal, and a semiconductor device including a first rank and a second rank configured to calibrate each termination resistance, based on the command address, the first chip selection signal, and the second chip selection signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.