Patent · US Active

Microscopy system and method for modifying microscope images in the feature space of a generative network

US12228722B2 · kind B2 · utility

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20Claims
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Key dates

Filing dateDec 16, 2022
Grant dateFeb 18, 2025
Priority date
Expiry dateMar 2, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/20084
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In a computer-implemented method for modifying microscope images, a generative model is trained using a training dataset which comprises a plurality of microscope images. After the training, the generative model is configured to compute a generated microscope image from a feature vector derived from a feature space. It is established which image properties are affected by which feature variables in the feature space. A microscope image to be modified is received and projected into the feature space in order to obtain an associated feature vector. One or more feature variables of the feature vector are modified in order to change one or more image properties, whereby a modified feature vector is generated. The modified feature vector is projected back into an image space by inputting the modified feature vector into the generative model, thereby generating a modified microscope image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.