Parallel test cell with self actuated sockets
US12235314B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2022 |
| Grant date | Feb 25, 2025 |
| Priority date | — |
| Expiry date | Jan 18, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automated test equipment (ATE) includes a test interface board assembly. The test interface board includes a socket configured to provide electrical couplings from the test interface board to a device under test (DUT). The socket is further configured to accept an active thermal interposer (ATI) device while the DUT is disposed in the socket. The socket includes a plurality of spring-loaded roller retention devices configured to retain one or more devices in the socket. The ATE further includes a Z-axis interface plate configured to open the plurality of spring-loaded roller retention devices to enable insertion of the DUT into the socket and an ATI placement plate configured to open the plurality of spring-loaded roller retention devices to enable insertion of the ATI device into the socket.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.