Test system support component exchange system and method
US12235315B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 21, 2022 |
| Grant date | Feb 25, 2025 |
| Priority date | — |
| Expiry date | Jun 8, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2879
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The presented systems and methods enable efficient and effective exchange of test support components. There are a variety of different test support components (e.g., active thermal interposer (ATI) device, exchange kit, etc.) that are configured to support various testing functions. In one embodiment, an automated test equipment (ATE) system comprises: a support component configured to enable support functions associated with testing of a device under test (DUT); a support component head configured to selectively couple with the support component; and an exchange socket configured to hold the support component for a portion of selectively coupling the support component and the support component head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.