Fin smoothing and integrated circuit structures resulting therefrom
US12237420B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 23, 2024 |
| Grant date | Feb 25, 2025 |
| Priority date | — |
| Expiry date | Apr 23, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/017
Abstract
Fin smoothing, and integrated circuit structures resulting therefrom, are described. For example, an integrated circuit structure includes a semiconductor fin having a protruding fin portion above an isolation structure, the protruding fin portion having substantially vertical sidewalls. The semiconductor fin further includes a sub-fin portion within an opening in the isolation structure, the sub-fin portion having a different semiconductor material than the protruding fin portion. The sub-fin portion has a width greater than or less than a width of the protruding portion where the sub-fin portion meets the protruding portion. A gate stack is over and conformal with the protruding fin portion of the semiconductor fin. A first source or drain region at a first side of the gate stack, and a second source or drain region at a second side of the gate stack opposite the first side of the gate stack.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.