Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
US12241911B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Feb 2, 2024 |
| Grant date | Mar 4, 2025 |
| Priority date | — |
| Expiry date | Feb 2, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q30/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.