Bede Pittenger
10Patents
3h-index
10Co-inventors
53Inventor score
Filing activity: May 26, 2009 → Feb 2, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7979916B2 | Preamplifying cantilever and applications thereof | Physics | 4 | Active |
| US11029330B2 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Physics | 4 | Active |
| US8997259B2 | Method and apparatus of tuning a scanning probe microscope | Physics | 4 | Active |
| US11635449B2 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Physics | 3 | Active |
| US9575090B2 | Force measurement with real-time baseline determination | Physics | 3 | Active |
| US11307220B2 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Physics | 3 | Active |
| US11940461B2 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Physics | 1 | Active |
| US9910064B2 | Force measurement with real-time baseline determination | Physics | 1 | Active |
| US9116167B2 | Method and apparatus of tuning a scanning probe microscope | Physics | 0 | Active |
| US12241911B2 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.