Rapid dot matrix micro-nano impact indentation testing system
US12247956B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 3, 2024 |
| Grant date | Mar 11, 2025 |
| Priority date | — |
| Expiry date | Jul 3, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0676
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention discloses a rapid dot matrix micro-nano impact indentation testing system. The rapid dot matrix micro-nano impact indentation testing system comprises a three-dimensional electric positioning module, wherein the three-dimensional electric positioning module comprises an XY translation stage and a Z-axis lifting stage; a dot matrix impact indentation module, wherein the dot matrix impact indentation module comprises a three-degree-of-freedom piezoelectric platform arranged on the Z-axis lifting stage, one surface of the three-degree-of-freedom piezoelectric platform is provided with a piezoelectric ceramic actuator, and one end of the piezoelectric ceramic actuator is connected to an indenter; a clamp, wherein the clamp clamps a test piece, and the test piece faces the indenter; and an imaging module, wherein the imaging module comprises a microscope lens. The system can achieve in-situ micro-nano impact indentation test and rapid dot matrix indentation, and has higher indentation precision.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.