Defect detection in image space
US12260538B2 · kind B2 · utility
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17Claims
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Key dates
| Filing date | Dec 8, 2020 |
| Grant date | Mar 25, 2025 |
| Priority date | — |
| Expiry date | Sep 23, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This invention relates to a method for training a neural network, comprising detecting a hole in each training image of a plurality of training images; transforming each training image into a transformed image, to suppress non-crack information in the training image; and training a neural network using the transformed images, to detect cracks in images (i.e. in objects in images).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.