Method for estimating a quality function of a mono- or multi-layered coated transparent substrate
US12287295B2 · kind B2 · utility
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Key dates
| Filing date | May 18, 2021 |
| Grant date | Apr 29, 2025 |
| Priority date | — |
| Expiry date | Apr 23, 2042 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A computer implemented methods for estimating at least one quality function of a given layered coating on a transparent substrate allows to predict at least one non in-process measured quality function of a given layered coating on a transparent substrate from an in-process measured quality function which can be acquired on the coated substrate as deposited at any location, preferably at the end of a coating process. The method allows to get rid of in-process real-time continuous measurements of quality functions of the coated transparent substrate and real-time monitoring of coating process parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.