Thierry KAUFFMANN
4Patents
1h-index
10Co-inventors
37Inventor score
Filing activity: Jun 30, 2016 → May 18, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10843962B2 | Substrate provided with a stack having thermal properties | Physics | 1 | Active |
| US11739417B2 | Method and a device for automatically determining adjustment values for operating parameters of a deposition line | Electricity | 0 | Active |
| US11352691B2 | Method and device for locating the origin of a defect affecting a stack of thin layers deposited on a substrate | Physics | 0 | Active |
| US12287295B2 | Method for estimating a quality function of a mono- or multi-layered coated transparent substrate | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.