Patent · US Active

Plasma processing method and plasma processing apparatus

US12315698B2 · kind B2 · utility

0Cited by
2References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 6, 2021
Grant dateMay 27, 2025
Priority date
Expiry dateJun 16, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/334
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus includes: a plasma processing chamber; a substrate support disposed in the plasma processing chamber; a source RF generator coupled to the plasma processing chamber, and configured to generate a pulse source RF signal including a plurality of source cycles; and a bias RF generator coupled to the substrate support, and configured to generate a pulse bias RF signal. A transition timing to the bias operating state in each bias cycle is delayed with respect to a transition timing to the source operating state in a corresponding source cycle, the source non-operating period overlaps with the bias non-operating period, and the bias operating period in each bias cycle overlaps with the source operating period in the next source cycle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.