X-ray imaging system
US12329561B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 15, 2024 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Apr 15, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of performing scatter correction on an X-ray image is disclosed. The method comprises obtaining an input image for processing based on a source X-ray image of a sample acquired using an X-ray detector, and determining a model of the sample based on the input image. The model is then evaluated by computing, based on the model, simulated X-ray image data and evaluating the simulated image data against the input image to determine whether a convergence criterion is fulfilled. An updated model of the sample is generated if the convergence criterion is not fulfilled. The model evaluating step is repeated based on one or more successive updated models until the convergence criterion is fulfilled in a final iteration, and scatter correction is then performed on the source X-ray image using simulated image data computed during the final iteration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.