Patent · US Active

Substrate processing apparatus and substrate processing method

US12334366B2 · kind B2 · utility

0Cited by
0References
14Claims
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Assignee

Inventors

Key dates

Filing dateDec 14, 2021
Grant dateJun 17, 2025
Priority date
Expiry dateFeb 5, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68742
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A substrate processing apparatus includes a spin chuck that holds a substrate, and a fluid nozzle disposed to face a principal surface of the substrate which is held by the spin chuck. The fluid nozzle includes a gas discharge port from which a gas is discharged radially from the center side of the principal surface of the substrate to the peripheral edge side, and a gas flow passage through which the gas is supplied to the gas discharge port, the gas flow passage having a tubular shape along an intersecting direction with respect to the principal surface of the substrate. The gas flow passage has a gas retaining portion whose flow passage cross-sectional area is larger than other portions of the gas flow passage, and a rectifying structure provided in a portion of the gas flow passage different from the gas retaining portion, the rectifying structure that rectifies a flow of the gas in the gas flow passage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.