Patent · US Active

Method and device for determining the optimal position of the focal plane for examining a specimen by microscopy

US12335614B2 · kind B2 · utility

0Cited by

0References

9Claims

0Family size

Assignee

Carl Zeiss Microscopy GmbH · DE

Inventors

Markus Sticker · Jena, DE
Christoph Husemann · Jena, DE
Lutz Schaefer · Kitchener, CA

Key dates

Filing date	Feb 8, 2022
Grant date	Jun 17, 2025
Priority date	—
Expiry date	Aug 18, 2043

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/365
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A method for determining the optimal position of the focal plane for examining a specimen by microscopy can include a) illuminating the specimen with light and recording images at different positions of the focal plane to provide a stack of intensity images, b) calculating a phase image from at least two intensity images, with the calculated phase image being assigned a focal plane position located within a focal plane region whose boundaries are the two most spaced apart positions of the focal plane of the at least two intensity images, c) repeating step b) multiple times with different intensity images such that a stack of phase images is available, d) calculating at least one focus measure value for each phase image, and e) determining the optimal position of the focal plane on the basis of the calculated focus measure values and the focal plane positions assigned to the phase images.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.