X-ray diffraction imaging detector having multiple angled input faces
US12339239B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 27, 2023 |
| Grant date | Jun 24, 2025 |
| Priority date | — |
| Expiry date | Sep 29, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/20185
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A detector assembly of an X-ray system, the detector assembly includes: (a) an optical sensor having a first surface, the optical sensor configured to receive optical radiation impinging on the first surface, and to produce an electrical signal responsively to the optical radiation, (b) a fiber optic plate (FOP) disposed over the first surface of the optical sensor, the FOP includes: (i) one or more optical fibers disposed at an acute angle relative to a normal to the first surface, the one or more optical fibers are configured to convey the optical radiation to the optical sensor, and (ii) a second surface, which is oblique to the first surface, and (c) a scintillator layer disposed on the second surface of the FOP and configured to convert an X-ray beam into the optical radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.