Background memory scan block selection
US12346594B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 8, 2023 |
| Grant date | Jul 1, 2025 |
| Priority date | — |
| Expiry date | Nov 8, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F13/28
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The memory sub-systems of the present disclosure selects, for memory scans, a memory block which has a highest page fill ratio. In one embodiment, the memory sub-system identifies a number of block stripes located on a logical unit (LU) identified by a logical unit number (LUN), where the LU is one of a plurality of LUs of a memory device. The sub-system determines a fill ratio for each of the plurality of block stripes. The sub-system selects, among the block stripes, a block stripe with a highest fill ratio. The sub-system identifies, from the selected block stripe, a memory block of the LU. The sub-system performs a memory scan operation on the memory block of the memory device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.