Error detection for a semiconductor device
US12362032B2 · kind B2 · utility
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3References
22Claims
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Key dates
| Filing date | Aug 16, 2022 |
| Grant date | Jul 15, 2025 |
| Priority date | — |
| Expiry date | Aug 1, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/789
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure includes apparatus, methods, and systems for error detection for a semiconductor device. An apparatus includes a memory array, a detector array, and a detector coupled to the detector array. The detector is configured to detect an error in a portion of the detector array and output an output signal to memory components coupled to the detector array in response to detecting the error.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.