Ultrasound inspection calibration using a target
US12372499B2 · kind B2 · utility
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4References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 17, 2021 |
| Grant date | Jul 29, 2025 |
| Priority date | — |
| Expiry date | Jan 22, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/106
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Examples of the present subject matter provide a calibration technique to configure inspection parameters directly on an object. The calibration technique may include a target device configured to be placed on a testing surface of an object for calibration. The target device may reflect acoustic waves transmitted from a transducer probe. The reflected acoustic waves may then be used for determining one or more characteristics of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.