Method for training feature extraction model, method for classifying image, and related apparatuses
US12380681B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2023 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Apr 3, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/7784
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure provides a method for training a feature extraction model, a method for classifying an image and related apparatuses, and relates to the field of artificial intelligence technology such as deep learning and image recognition. The scheme comprises: extracting an image feature of each sample image in a sample image set using a basic feature extraction module of an initial feature extraction model, to obtain an initial feature vector set; performing normalization processing on each initial feature vector in the initial feature vector set using a normalization processing module of the initial feature extraction model, to obtain each normalized feature vector; and guiding training for the initial feature extraction model through a preset high discriminative loss function, to obtain a target feature extraction model as a training result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.