Rapid high-resolution computerized tomography
US12385857B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2022 |
| Grant date | Aug 12, 2025 |
| Priority date | — |
| Expiry date | May 31, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/3306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting an object using CT is provided. In an embodiment, the method can include providing an object for an inspection. The object can be provided on a base configured to rotate the object. The method can also include acquiring a first plurality of inspection data characterizing the object during rotation through a first scan sector. The first plurality of inspection data can be acquired by a first inspection chain. The method can further include acquiring a second plurality of inspection data characterizing the object during rotation through a second scan sector. The second plurality of inspection data can be acquired by a second inspection chain. The method can also include providing the first plurality of inspection data and the second plurality of inspection data. Related systems, apparatuses, and non-transitory computer readable mediums are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.