Constrained random simulation using machine learning and Bayesian estimation
US12399219B1 · kind B1 · utility
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20Claims
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Key dates
| Filing date | Aug 18, 2023 |
| Grant date | Aug 26, 2025 |
| Priority date | — |
| Expiry date | Oct 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Certain aspects of the present disclosure are directed towards a method for circuit testing. The method generally includes: determining a probability distribution indicating prior failure probabilities associated with a circuit design; determining a first likelihood associated with occurrence of at least one failure for the circuit design; determining a quantity of test instances to be performed using simulation to detect the at least one failure based on the probability distribution and the first likelihood; and outputting the quantity of test instances.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.