Patent · US Active

Memory system characteristic control

US12399819B2 · kind B2 · utility

0Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 18, 2024
Grant dateAug 26, 2025
Priority date
Expiry dateMar 18, 2044

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F12/0246
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method includes configuring a memory system with a first set of operating characteristics corresponding to a first thermal voltage model, monitoring operation of the memory system, selecting a second thermal voltage model based on the monitored operation of the memory system, configuring the memory system with a second set of operating characteristics corresponding to the second thermal voltage model, and writing data to the memory system configured with the second set of operating characteristics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.