Hybrid wire localization length measurement device
US12405101B2 · kind B2 · utility
0Cited by
0References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 23, 2023 |
| Grant date | Sep 2, 2025 |
| Priority date | — |
| Expiry date | Nov 25, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N10/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A superconductor-semiconductor device is provided, including a hybrid superconductor-semiconductor wire. The superconductor-semiconductor device may further include a hybrid localization length (LL) measurement device including a plurality of contact gates located above the hybrid superconductor-semiconductor wire in a thickness direction. The hybrid LL measurement device may further include a conductance sensor electrically coupled to the plurality of contact gates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.