Optical element for a EUV projection exposure system
US12406777B2 · kind B2 · utility
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2References
14Claims
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Key dates
| Filing date | Dec 22, 2022 |
| Grant date | Sep 2, 2025 |
| Priority date | — |
| Expiry date | Mar 13, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/067
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
In a method for producing an optical element for an EUV projection exposure apparatus, a shaping layer (221) is applied onto a substrate (20) so as to have a surface roughness of at most 0.5 nm rms directly after the application of the shaping layer onto the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.