Patent · US Active

Semiconductor cleaning apparatus and method

US12420314B2 · kind B2 · utility

0Cited by
11References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 18, 2019
Grant dateSep 23, 2025
Priority date
Expiry dateOct 18, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68785
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present disclosure describes a chuck-based device and a method for cleaning a semiconductor manufacturing system. The semiconductor manufacturing system can include a chamber, a chuck housed in the chamber and configured to hold a substrate, and a control device configured to control a translational displacement and a rotation of the chuck. The chuck can include a passage extending along a periphery of the chuck and dividing the chuck into an inner portion and an outer sidewall portion, and a first multiple of openings through the outer sidewall portion of the chuck and interconnected with the passage. The passage can be configured to transport a fluid. The first multiple of openings can be configured to dispense the fluid.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.