Patent · US Active

Slurry composition and method of manufacturing integrated circuit device by using the same

US12421424B2 · kind B2 · utility

0Cited by
3References
11Claims
0Family size

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Key dates

Filing dateJan 18, 2023
Grant dateSep 23, 2025
Priority date
Expiry dateDec 30, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/482
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

A slurry composition is used to treat a surface of a target structure including at least one of a first polishing target film and a second polishing target film, which include different materials from each other, by a chemical mechanical polishing (CMP) process. The slurry composition includes: polishing particles; a first inhibitor including a nonionic polymer to selectively bond to the first polishing target film; and a second inhibitor including an anionic polymer to selectively bond to the second polishing target film. A method of manufacturing an integrated circuit device includes: forming, on a substrate, a target structure including at least one of a first polishing target film and a second polishing target film; applying the slurry composition onto the target structure; and treating a surface of the target structure by a CMP process while the slurry composition covers the target structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.