Patent · US Expired

LPE technique for reducing edge growth

US3950195A · kind A · utility

13Cited by
1References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 21, 1975
Grant dateApr 13, 1976
Priority date
Expiry dateFeb 21, 1995

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02625
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Described is a liquid phase epitaxy technique using conventional slider apparatus in which, after heating the source solution to saturation, the solution temperature is rapidly reduced so that supersaturation takes place but heterogeneous nucleation does not. The solution is allowed to reach convective equilibrium and only then is brought into contact with the substrate. Once in contact, the temperature is maintained constant so that convection currents in the solution are substantially reduced. This technique has several advantages: reduced edge growth, increased usable wafer area, and reduced wipe-off problems.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.