Patent · US Expired

Semiconductor devices

US3983572A · kind A · utility

10Cited by
2References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 18, 1974
Grant dateSep 28, 1976
Priority date
Expiry dateOct 18, 1994

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention is concerned with methods for producing improved semiconductor devices. The invention is advantageously employable in the fabrication of insulated-gate field-effect transistor devices. The problem of accurately aligning the gate electrode over the channel region, lying between the source region and the drain region of a field effect transistor, is particularly addressed and solved. Accurate and precise field protection of all areas of the field-effect transistor surrounding the channel, source and drain regions is simply and effectively accomplished. The proper alignment of the gate electrode is largely accomplished by utilizing essentially the same mask structure to define the gate, source and drain regions. The same mask structure is utilized to define the area that is field protected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.