Micro-circuit test probe
US4001685A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 11, 1974 |
| Grant date | Jan 4, 1977 |
| Priority date | — |
| Expiry date | Oct 11, 1994 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/067
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for testing integrated circuit components which includes a dielectric support body, conductive arms supported by the body and with the arms including a longer arm and a shorter arm. The shorter arm is positioned above the longer arm in spaced relation thereto with each arm having an outer end connected to a conductive probe tip. The probe tip includes a downwardly positioned point for contact with a surface having an integrated circuit defined thereon and contact means are provided which cooperate with the arms and tip to transmit an electrical signal to the tip or receive a signal from the tip. The probe tip includes a thin-walled bent tube that is secured to the probe. The bend in the thin-walled tube serves to frictionally hold a needle in the thin-walled tube because on insertion of a needle the tube will be resiliently straightened to create a frictional force between the tube and the needle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.