Electroglas, Inc.
🏢 View company profile →38Patents
2Active
38Granted
37Portfolio score
Filing activity: Jan 28, 1974 → Jul 24, 2006 · 2 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5450203A | Method and apparatus for determining an objects position, topography and for imaging | Physics | 231 | Expired |
| US6096567A | Method and apparatus for direct probe sensing | Physics | 150 | Expired |
| US5656942A | Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane | Physics | 120 | Expired |
| US4066943A | High speed precision chuck assembly | Emerging Cross-Sectional Technologies | 117 | Expired |
| US3936743A | High speed precision chuck assembly | Emerging Cross-Sectional Technologies | 112 | Expired |
| US6320372A | Apparatus and method for testing a substrate having a plurality of terminals | Physics | 103 | Expired |
| US4001685A | Micro-circuit test probe | Physics | 99 | Expired |
| US5515452A | Optical character recognition illumination method and system | Electricity | 68 | Expired |
| US4123706A | Probe construction | Physics | 58 | Expired |
| US5703969A | System and method for recognizing visual indicia | Physics | 35 | Expired |
| US5982132A | Rotary wafer positioning system and method | Emerging Cross-Sectional Technologies | 21 | Expired |
| US3939414A | Micro-circuit test apparatus | Physics | 21 | Expired |
| US7453260B2 | Testing circuits on substrate | Physics | 19 | Active |
| US4056777A | Microcircuit test device with multi-axes probe control | Physics | 18 | Expired |
| US4034293A | Micro-circuit test probe | Physics | 17 | Expired |
| US3940676A | Damping control for positioning apparatus | Electricity | 17 | Expired |
| US7352198B2 | Methods and apparatuses for improved stabilization in a probing system | Physics | 8 | Expired |
| US6547409B2 | Method and apparatus for illuminating projecting features on the surface of a semiconductor wafer | Electricity | 8 | Expired |
| US6417683B1 | Apparatus for electrical testing of a substrate having a plurality of terminals | Physics | 7 | Expired |
| US6310985A | Measuring angular rotation of an object | Physics | 5 | Expired |
| US5344238A | Ball bearing assembly | Emerging Cross-Sectional Technologies | 5 | Expired |
| US7368929B2 | Methods and apparatuses for improved positioning in a probing system | Physics | 5 | Active |
| US6711304B2 | Method and apparatus for measuring angular rotation of an object | Physics | 5 | Expired |
| US6389702B1 | Method and apparatus for motion control | Electricity | 4 | Expired |
| US6781394B1 | Testing circuits on substrate | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.