Patent · US Expired

Interchangeable specimen trays and apparatus for a vacuum type testing system

US4033904A · kind A · utility

5Cited by
8References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 24, 1975
Grant dateJul 5, 1977
Priority date
Expiry dateDec 24, 1995

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG21K5/10
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The vacuum chamber for an Auger analyzer is provided with a side access port through which interchangeable specimen trays are inserted and installed on a rotatable support structure. The specimen tray has a plurality of peripheral specimen sites and a Faraday cup probe structure similarly positioned but affixed to the support structure. The Faraday cup facilitates calibrating the ion beam and positioning the ion beam and the cup at the focal point of the electron beam. The support structure is subsequently rotated to sequentially expose each specimen to the beams.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.