Robert L. Gerlach
25Patents
13h-index
23Co-inventors
81Inventor score
Filing activity: Dec 24, 1975 → Sep 15, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6414307B1 | Method and apparatus for enhancing yield of secondary ions | Emerging Cross-Sectional Technologies | 65 | Expired |
| US6900447B2 | Focused ion beam system with coaxial scanning electron microscope | Electricity | 53 | Expired |
| US4659899A | Vacuum-compatible air-cooled plasma device | Electricity | 28 | Expired |
| US4412771A | Sample transport system | Emerging Cross-Sectional Technologies | 27 | Expired |
| US4048498A | Scanning auger microprobe with variable axial aperture | Electricity | 26 | Expired |
| US5241182A | Precision electrostatic lens system and method of manufacture | Electricity | 23 | Expired |
| US4810880A | Direct imaging monochromatic electron microscope | Electricity | 21 | Expired |
| US6797953B2 | Electron beam system using multiple electron beams | Electricity | 19 | Expired |
| US6946654B2 | Collection of secondary electrons through the objective lens of a scanning electron microscope | Electricity | 19 | Expired |
| US7009187B2 | Particle detector suitable for detecting ions and electrons | Electricity | 17 | Expired |
| US6683320B2 | Through-the-lens neutralization for charged particle beam system | Electricity | 17 | Expired |
| US4345152A | Magnetic lens | Electricity | 14 | Expired |
| US6710338B2 | Focused ion beam system | Electricity | 14 | Expired |
| US4205226A | Auger electron spectroscopy | Electricity | 12 | Expired |
| US5032724A | Multichannel charged-particle analyzer | Electricity | 11 | Expired |
| US6949756B2 | Shaped and low density focused ion beams | Electricity | 10 | Expired |
| US6977386B2 | Angular aperture shaped beam system and method | Electricity | 8 | Expired |
| US4296323A | Secondary emission mass spectrometer mechanism to be used with other instrumentation | Performing Operations; Transporting | 8 | Expired |
| US6797969B2 | Multi-column FIB for nanofabrication applications | Electricity | 7 | Expired |
| US4033904A | Interchangeable specimen trays and apparatus for a vacuum type testing system | Physics | 5 | Expired |
| US4882487A | Direct imaging monochromatic electron microscope | Electricity | 3 | Expired |
| US8164059B2 | In-chamber electron detector | Electricity | 3 | Active |
| US4806754A | High luminosity spherical analyzer for charged particles | Electricity | 2 | Expired |
| US10715771B1 | Wide-gamut-color image formation and projection | Electricity | 1 | Active |
| US8650975B2 | Test specimen for testing through-thickness properties | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.