Micro-circuit test probe
US4034293A · kind A · utility
17Cited by
2References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 8, 1975 |
| Grant date | Jul 5, 1977 |
| Priority date | — |
| Expiry date | May 8, 1995 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/067
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for testing integrated circuit components which includes a dielectric support body, conductive arms supported by the body and with the arms including a longer arm and a shorter arm. The shorter arm is positioned above the longer arm in spaced relation thereto with each arm having an outer end connected to a conductive probe tip. The probe tip includes a downwardly positioned point for contact with a surface having an integrated circuit defined thereon and contact means are provided which cooperate with the arms and tip to transmit an electrical signal to the tip or receive a signal from the tip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.