Patent · US Expired

Adjusting device for magnetic probes

US4063159A · kind A · utility

2Cited by

4References

8Claims

0Family size

Assignee

Institut Dr. Friedrich Forster Prufgeratebau GmbH & Co. KG · DE

Inventor

Peter Haberlein · Reutlingen, DE

Key dates

Filing date	Jun 18, 1976
Grant date	Dec 13, 1977
Priority date	—
Expiry date	Jun 18, 1996

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/022
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A magnetic field probe is supported within a hollow base at one end by a resilient spring element and at its other end by a member adjustable to move the probe transversely of the axis defined by the probe ends. The spring element biases the probe in a direction transversely of the probe axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.