Peter Haberlein
5Patents
3h-index
1Co-inventors
47Inventor score
Filing activity: Jun 18, 1976 → May 25, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5550468A | Method and apparatus for adjusting the operating diameter of a probe in a rotating testing head | Physics | 40 | Expired |
| US4314203A | Test arrangement for the non-destructive testing of metallic test pieces | Physics | 12 | Expired |
| US4270089A | Scanning magnetic test head | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6344740B1 | Guide device for testing elongated objects | Performing Operations; Transporting | 3 | Expired |
| US4063159A | Adjusting device for magnetic probes | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.