Patent · US Expired

Method for the nondestructive testing of voltage limiting blocks

US4112362A · kind A · utility

5Cited by
2References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 1976
Grant dateSep 5, 1978
Priority date
Expiry dateDec 30, 1996

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R15/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for the nondestructive testing of voltage limiting blocks includes the steps of providing several discrete electrical contacts across the block, sequentially applying to each of the contacts a voltage to determine the corresponding current and utilizing the current and voltage values to determine constants related to the microstructure of that particular location. The constants can then be utilized to derive a contour map which will be indicative of a hot spot in such block as determined by a maxima of the contour map.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.