Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material
US4115690A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 3, 1977 |
| Grant date | Sep 19, 1978 |
| Priority date | — |
| Expiry date | Jun 3, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.