Unit Process Assemblies, Inc.
7Patents
0Active
7Granted
25Portfolio score
Filing activity: Dec 2, 1974 → Jun 2, 1978
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4155009A | Thickness measurement instrument with memory storage of multiple calibrations | Physics | 29 | Expired |
| US4079237A | Card controlled beta backscatter thickness measuring instrument | Physics | 15 | Expired |
| US4046994A | Control card receiving and sensing assembly | Physics | 8 | Expired |
| US4042880A | Electrode assembly for measuring the effective thickness of thru-hole plating circuit board workpieces | Physics | 7 | Expired |
| US4190770A | Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material | Physics | 4 | Expired |
| US4115690A | Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material | Physics | 4 | Expired |
| US4229652A | Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.