Probe construction
US4123706A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 11, 1977 |
| Grant date | Oct 31, 1978 |
| Priority date | — |
| Expiry date | Jan 11, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/067
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for testing an electrical circuit includes a dielectric support body and a pair of spring arms each having an inner end fixed to the support body and an outer end free to deflect with respect to the support body. Means for connecting the outer ends of the arms supports a probe tip having a point movable with the deflection of the arms into contact with a predetermined point on the electrical circuit to be tested. Means responsive to a signal provides for the deflection of the arms and the movement of the probe tip into contact with the chip. The arms have different lengths providing the probe tip with movement along a substantially straight line with respect to the plane of the electrical circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.