Mass spectrometer for ultra-rapid scanning
US4171482A · kind A · utility
7Cited by
2References
4Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 27, 1977 |
| Grant date | Oct 16, 1979 |
| Priority date | — |
| Expiry date | Dec 27, 1997 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/284
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The invention relates to a mass spectrometer for rapid scanning. A magnetic sector focuses a collimated beam containing the various ion species in a focal plane. The focused beams reach this focal plane at an angle of 45.degree.. The beams emerging from this focal plane are refocused in an electrostatic deflector having parallel plates. One of these plates is provided with a slit through which the beams are received. Scanning is brought about by varying the voltage applied to the electrostatic deflector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.