Cameca
🏢 View company profile →16Patents
5Active
16Granted
37Portfolio score
Filing activity: Dec 27, 1977 → Feb 12, 2010 · 5 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4564758A | Process and device for the ionic analysis of an insulating sample | Electricity | 24 | Expired |
| US4779046A | Electron beam integrated circuit tester | Physics | 11 | Expired |
| US4983831A | Time-of-flight analysis method with continuous scanning and analyzer to implement this method | Electricity | 10 | Expired |
| US4748325A | Method and device to discharge samples of insulating material during ion analysis | Electricity | 10 | Expired |
| US4508967A | Electronic optical apparatus comprising pyrolytic graphite elements | Electricity | 9 | Expired |
| US4171482A | Mass spectrometer for ultra-rapid scanning | Electricity | 7 | Expired |
| US4912325A | Method for sample analysis by sputtering with a particle beam, and device to implement said method | Electricity | 6 | Expired |
| US5038045A | Composite electromagnetic lens with variable focal distance | Electricity | 5 | Expired |
| US8074292B2 | High resolution wide angle tomographic probe | Electricity | 5 | Active |
| US5189304A | High transmission mass spectrometer with improved optical coupling | Electricity | 5 | Expired |
| US6259530A | Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzer | Physics | 4 | Expired |
| US8502139B2 | Mass analysis device with wide angular acceptance including a reflectron | Electricity | 3 | Active |
| US8276210B2 | Tomographic atom probe comprising an electro-optical generator of high-voltage electrical pulses | Electricity | 2 | Active |
| US7049588B2 | Device for measuring the emission of X-rays produced by an object exposed to an electron beam | Electricity | 1 | Expired |
| US8247766B2 | Device for generating wide spectral band laser pulses, particularly for a tomographic atom probe | Physics | 1 | Active |
| US8373121B2 | Magnetic achromatic mass spectrometer with double focusing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.