Patent · US Expired

Semiconductor device and a method for manufacturing the same

US4185294A · kind A · utility

11Cited by
8References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 17, 1978
Grant dateJan 22, 1980
Priority date
Expiry dateApr 17, 1998

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device comprises a semiconductor substrate, an insulating layer formed on one surface of the semiconductor substrate, a wiring layer formed on at least a portion of that area of the semiconductor substrate where no insulating layer is formed and having substantially the same thickness as that of the insulating layer, an insulating film formed flat on the insulating layer and wiring layer in a manner that it occupies grooves between the insulating layer and the wiring layer, an intermediate insulating layer formed on the insulating film, and another wiring layer formed on the intermediate insulating layer. The semiconductor device has a rupture-free multi-layer structure which exhibits an excellent electrical property.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.