Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material
US4190770A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 1977 |
| Grant date | Feb 26, 1980 |
| Priority date | — |
| Expiry date | Nov 15, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A backscatter measurement device for measuring the thickness of a coating on elements forming a web of substrate material moving from a feed supply to a take-up location at a predetermined speed. A measurement wheel is provided, adjacent to the rim of which is mounted a backscatter probe for irradiating and detecting the backscattered radiation from a coated substrate. The web of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving web whereby the probe and an adjacent point on the web are stationary relative to one another while the point on the web is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated web. This backscatter measurement device is further provided with indexing apparatus to position automatically the probe directly adjacent an element to be measured on the web.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.