Method of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniques
US4196475A · kind A · utility
32Cited by
9References
33Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 2, 1976 |
| Grant date | Apr 1, 1980 |
| Priority date | — |
| Expiry date | Sep 2, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This disclosure is concerned with a new technique for automatically measuring impedance (though the process is also applicable to other parameters and characteristics as well) wherein a series of voltages are sequentially presented to a common detector and analog-to-digital converter, the numerical values of which voltages are of themselves meaningless, but from which, with the aid of microprocessor calculating equipment, ratios may be calculated that indicate impedance (or other parameters).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.