Genrad, Inc.
🏢 View company profile →72Patents
0Active
72Granted
38Portfolio score
Filing activity: Sep 2, 1976 → Oct 4, 2001
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6138143A | Method and apparatus for asynchronous transaction processing | Emerging Cross-Sectional Technologies | 265 | Expired |
| US4620304A | Method of and apparatus for multiplexed automatic testing of electronic circuits and the like | Physics | 191 | Expired |
| US6393458B1 | Method and apparatus for load balancing in a distributed object architecture | Emerging Cross-Sectional Technologies | 138 | Expired |
| US6175230A | Circuit-board tester with backdrive-based burst timing | Physics | 110 | Expired |
| US4186338A | Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems | Physics | 83 | Expired |
| US5506510A | Adaptive alignment probe fixture for circuit board tester | Physics | 58 | Expired |
| US4228537A | Method of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis | Physics | 53 | Expired |
| US5861743A | Hybrid scanner for use in an improved MDA tester | Physics | 51 | Expired |
| US4242751A | Automatic fault-probing method and apparatus for checking electrical circuits and the like | Physics | 51 | Expired |
| US5172377A | Method for testing mixed scan and non-scan circuitry | Physics | 38 | Expired |
| US4977370A | Apparatus and method for circuit board testing | Physics | 35 | Expired |
| US4459693A | Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like | Physics | 33 | Expired |
| US4196475A | Method of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniques | Physics | 32 | Expired |
| US4236246A | Method of and apparatus for testing electronic circuit assemblies and the like | Physics | 28 | Expired |
| US4808815A | Apparatus for testing light-emitting devices using probe means having a preselected pattern arrangement | Physics | 25 | Expired |
| US5057775A | Method of testing control matrices for flat-panel displays | Physics | 22 | Expired |
| US5486753A | Simultaneous capacitive open-circuit testing | Physics | 20 | Expired |
| US5124636A | Tester interconnect system | Physics | 20 | Expired |
| US4951283A | Method and apparatus for identifying defective bus devices | Physics | 20 | Expired |
| US4414664A | Wait circuitry for interfacing between field maintenance processor and device specific adaptor circuit | Physics | 20 | Expired |
| US5282211A | Slip detection during bit-error-rate measurement | Electricity | 19 | Expired |
| US5124638A | Automatic circuit tester employing a three-dimensional switch-matrix layout | Physics | 19 | Expired |
| US6233509A | Electronic diagnostic system | Performing Operations; Transporting | 18 | Expired |
| US5736862A | System for detecting faults in connections between integrated circuits and circuit board traces | Physics | 18 | Expired |
| US5592614A | Fault identification system | Physics | 17 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.