Optical temperature measurement technique utilizing phosphors
US4215275A · kind A · utility
85Cited by
5References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 15, 1978 |
| Grant date | Jul 29, 1980 |
| Priority date | — |
| Expiry date | Feb 15, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/3213
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A technique wherein an object or environment to be measured is provided with a phosphor material layer that emits at least two optically isolatable wavelength ranges whose intensity ratio depends upon the object or environment temperature. This technique is applied to remote hostile environment point temperature measurements, such as in large enclosed electrical power transformers and other large equipment, to the measurement of surface temperatures, such as in airplane structures being tested in wind tunnels, and elsewhere.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.